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  • 產(chǎn)品名稱：Ossila太陽能電池IV測(cè)試系統(tǒng)

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  • 產(chǎn)品廠商：Ossila
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Part of the Institute of Physics award-winning Ossila Solar Cell Prototyping platform , the Ossila Solar Cell I-V System is a low-cost solution for reliable characterisation of photovoltaic devices. The PC software (included with all variants of the system) measures the current-voltage curve of a solar cell and then automatically calculates key device properties. In addition, I-V measurements can be performed periodically over time to track the stability of these properties.

The system is available with either manual or automatic pixel switching (if you are using one of Ossila's substrate systems), or without a test board for use with your own substrate and testing system or if you already own one of our test boards. Please refer to the table under the specifications tab if you are not sure which model you should choose. This system is covered by our FREE 2-year warranty.

Solar Cell I-V Test System Specifications

Voltage Source ±333 μV to ±10 V
Current Measurement ±10 nA to ±200 mA
Substrate Size 20 mm x 15 mm or 25 mm x 25 mm
Substrate Compatibility - T2002A/T2003A S101 (OLED substrates)
Substrate Compatibility - T2002B/T2003B S211 (PV substrates)
Substrate Compatibility - T2002B/T2003C S171 (Pixelated cathode substrates)
Substrate Compatibility - T2002E/T2003E S2006 (ITO Glass Substrates - PV and OLED 25mm Square)
Overall Dimensions - Manual Source Measure Unit: Width: 125 mm; Height: 55 mm; Depth: 185 mm
Test Board: Width: 105 mm; Height: 40 mm; Depth: 125 mm
Overall Dimensions - Automated Width: 155 mm; Height: 73 mm; Depth: 317 mm

System Selection Guide

The table below will help you determine which system is right for you. The manual version of the system has switches on the test board itself, which the user operates to measure the different pixels on a solar cell device. The automated version of the system uses a multiplexing test board, which switches between these pixels automatically. Note, if you use one of our substrates listed in the table and another kind of substrate as well, we recommend manual pixel switching, as the test board can be detached and replaced with another one.

Automated Solar Cell I-V Test System device holder
The system is capable of automatically switching between pixels during the measurement
Manual Solar Cell I-V Test System device holder
The twist lock ensures devices are securely held in the device holder

Key Features

Calculates Device Properties

The included PC software automatically calculates key properties of solar cells from the measured I-V curves. These properties include: the power conversion efficiency (PCE), fill factor (FF), short-circuit current density (Jsc), open-circuit voltage (Voc), maximum power (Pmax), shunt resistance (Rsh), and series resistance (Rs).

Rapid Characterisation

If you are using one of our substrate systems, the Solar Cell I-V System can be purchased with a multiplexing test board (just select the 'automated' variant of your choice in the drop-down list), which enables automatic pixel switching. As an added bonus, the temperature and light will also be recorded during the measurement!

Easy-to-Use

Just plug in the system, install the PC software, and you're ready to go! The intuitive interface and clean design makes the Solar Cell I-V System easy-to-use, simplifying the characterisation of solar cells.

Wide Measurement Range

The built-in source measure unit is capable of delivering voltages between -10 V and +10 V, with a maximum resolution of 333 μV, and measuring currents from as low as ±10 nA up to ±200 mA.

Measure Device Stability

By performing repeated current-voltage measurements over an extended period of time, the stability of key device properties can be tracked.

Multiple System Types Available

Choose from our range of system types (automated, manual, or source measure unit only) depending on your requirements. If you are unsure which model to select, refer to our comparison table on the specifications tab or contact us for advice.

System Type No Test Board Manual Multiplexer
±10 V Source Range Yes Yes Yes
±333 μV Source Resolution Yes Yes Yes
±200 mA Measurement Range Yes Yes Yes
±10 nA Measurement Resolution Yes Yes Yes
Software Included Yes Yes Yes
Automatic Solar Cell Characterisation Yes Yes Yes
Single Pixel Solar Lifetime Measurement Yes Yes Yes
For Use With S2006, S101, S211, or S171 Substrates No Yes Yes
Automatic Pixel Switching No No Yes
Multiple Pixels Solar Lifetime Measurement No No Yes

Please note that a solar simulator (not included) is needed to obtain standard efficiency measurements. Ossila does not currently supply solar simulators.

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